Book Chapters

• Tunnel FET-based Security Primitive Design
  Y. Bi, P. Gaillardon, X. Hu, M. Niemier and Y. Jin
  Functionality-Enhanced Devices An alternative to Moore's Law, IET Book, 2018.
  
• Polarity-Controllable Silicon NanoWire FET-Based Security
  Y. BI, P. Gaillardon, X. Hu, M. Niemier, J. Yuan and Y. Jin
  Security Opportunities in Nano Devices and Emerging Technologies, CRC Press, 2017.
  

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Journal Papers

• Attack vectors in stack cache memory
  N. Khoshavi, C. M. Maghsoudloo, Y. Bi, W. Francois, L. Jaimes and A. Sargolzaei
  Integration, the VLSI Journal, vol. 72, pp. 134-147, 2020.
  
• Logic Locking Using Hybrid CMOS and Emerging SiNW FETs
  Q. Alasad, J. Yuan and Y. Bi
  Electronics, vol. 6, no. 3, pp. 69, 2017.
  
• Tunnel FET Current Mode Logic for DPA-resilient Circuit Designs
  Y. Bi, K. Shamsi, J. Yuan, Y. Jin, M. Niemier and X. Hu
  IEEE Transactions on Emerging Topics in Computing, vol. 5, no. 3, pp. 340-352, 2017.
  
• E2LEMI: Energy-Efficient Logic Encryption Using Multiplexer Insertion
  Q. Alasad, Y. Bi and J. Yuan
  Electronics, vol. 6, no. 1, pp. 16, 2017.
  
• Emerging Technology-based Design of Primitives for Hardware Security
  Y. Bi, K. Shamsi, J. Yuan, P. Gaillardon, G. De Micheli, X. Yin, X. Hu, M. Niemier and Y. Jin
  ACM Journal on Emerging Technologies in Computing Systems (JETC), vol. 13, no. 1, pp. 3, 2016.
  
• Beyond the interconnections: Split manufacturing in RF designs
  Y. Bi, J. Yuan and Y. Jin
  Electronics, vol. 4, no. 3, pp. 541-564, 2015.
  
• Process and temperature robust voltage multiplier design for RF energy harvesting
  Y. Bi and J. Yuan
  Microelectronics Reliability, vol. 55, no. 1, pp. 107-113, 2015.
  
• Hot Carrier Injection Stress Effect on a 65 nm LNA at 70 GHz
  J. Yuan, Y. Xu, S. Yen, Y. Bi and G. Hwang
  IEEE Transactions on Device and Materials Reliability, vol. 14, no. 3, pp. 931-934, 2014.
  

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Conference/Workshop Papers

• Entropy-Based Modeling for Estimating Adversarial Bit-flip Attack Impact on Binarized Neural Network
  N. Khoshavi, S. Sargolzaei, Y. Bi and A. Roohi
  The 26th Asia and South Pacific Design Automation Conference (ASP-DAC), Jan. 2021.
  
• Fiji-FIN: A Fault Injection Framework on Quantized Neural Network Inference Accelerator
  N. Khoshavi, C. Broyles, Y. Bi and A. Roohi
  The 19th IEEE International Conference on Machine Learning and Applications (ICMLA), Dec. 2020.
  
• SHIELDeNN: Online Accelerated Framework for Fault-Tolerant Deep Neural Network Architectures
  N. Khoshavi, A. Roohi, C. Broyles, S. Sargolzaei, Y. Bi and DZ. Pan
  The 57th ACM/IEEE Design Automation Conference (DAC), July 2020.
  
• Hardware-assisted Black-box Adversarial Attack Evaluation Framework on Binarized Neural Network
  N. Khoshavi, A. Roohi and Y. Bi
  The 41st IEEE Symposium on Security and Privacy, short talks, May 2020.
  
• Entropy-Based Modeling for Estimating Soft Errors Impact on Binarized Neural Network Inference
  N. Khoshavi, A. Roohi, S. Sargolzaei, C. Broyles and Y. Bi
  arXiv preprint, 2020.
  
• Compression or Corruption? A Study on the Effects of Transient Faults on BNN Inference Accelerators
  N. Khoshavi, C. Broyles and Y. Bi
  IEEE International Symposium on Quality Electronic Design (ISQED), Santa Clara, Mar. 2020.
  
• Enhancing Hardware Security with Emerging Transistor Technologies
  Y. Bi, X. Hu, Y. Jin, M. Niemier, K. Shamsi and X. Yin
  ACM Great Lakes Symposium on VLSI (GLSVLSI), May 2016.
  
• Leverage Emerging Technologies for DPA-resilient Block Cipher Design
  Y. Bi, K. Shamsi, J. Yuan, F. Standaert and Yier Jin
  Design, Automation & Test in Europe (DATE), Mar. 2016.
  
• More Than Moore in Security: Emerging Device based Low-Power Differentiate Power Analysis Countermeasures
  Y. Bi, K. Shamsi, J. Yuan and Yier Jin
  Government Microcircuit Applications and Critical Technology Conference (GOMACTech-16), 2016.
  
• Reliable and High Performance STT-MRAM Architectures based on Controllable-polarity Devices
  K. Shamsi, Y. Bi, Y. Jin, P. Gaillardon, M. Niemier and X. Hu
  IEEE International Conference on Computer Design (ICCD), Oct. 2015.
  
• Leveraging Emerging Technology for Hardware Security - Case Study on Silicon Nanowire FETs and Graphene Symfets
  Y. Bi, P. Gaillardon, X. Hu, M. Niemier, J. Yuan and Y. Jin
  IEEE Asian Test Symposium (ATS), Nov. 2014.